Home » SSC Admit Card for Sub-Inspectors in Delhi Police, CAPFs And ASI in CISF-2017- Examination (Paper-I)

SSC Admit Card for Sub-Inspectors in Delhi Police, CAPFs And ASI in CISF-2017- Examination (Paper-I)

by Dhrubajyoti Haloi
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Staff Selection Commission (SSC) release Admit  Card for Sub-Inspectors in Delhi Police, CAPFSs And ASI in CISF-2017- Examination (Paper-I).


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Candidates  may  refer  to  the  Notice  of Sub-Inspectors   in   Delhi   Police,   CAPFs   and   Assistant   Sub Inspectors in CISF Examination, 2017.

In partial modification to the earlier announced date(s) of the  said  examination  from  30th June,  2017  to  7th July,  2017, the Commission would now be conducting the said examination from 1st July, 2017 to 7th July, 2017.

Candidates  are  informed  not  to  carry  any prohibited items,  such  as  watches,  books,  pens,  paper  chits, magazines, electronic gadgets (mobile phones, Bluetooth devices, head phones, pen/buttonhole cameras,  scanner,  calculator,  storage  devices  etc)  in the examination lab.

Assam Direct Recruitment Guide Book PDF

Assamese Medium: Click Here

English Medium: Click Here

Pen/pencil and paper for rough work would be provided  in  the  examination  lab.  Electronic  watch (timer)   will   be   available   on   the   computer   screen allotted to the candidates.

Candidate download Admit card for Delhi Police, CAPFs And ASI in CISF-2017- Examination (Paper-I) given below link..


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